Internationally renowned experts
The international review committee consists of a number of independent experts. They are reviewing the contributions of the conference to assure the outstanding scientific quality of the scientific papers respectively the relevance for application of the industrial papers.
These are the members of our review committee:
International Review Committee of LANE 2024 (preliminary)
M. Apel, Access e.V., Germany
C.B. Arnold, Princeton University, USA
P. Aubry, University of Paris-Saclay, France
S. Barcikowski, University of Duisburg-Essen, Germany
P. Bartolo, Nanyang Technological University, Singapore
B. Baudrit, SKZ - KFE gGmbH, Germany
J.P. Bergmann, Technische Universität Ilmenau, Germany
M. Booth, University of Oxford, United Kingdom
E. Bordatchev, National Research Council Canada, Canada
D. Bourell, University of Texas at Austin, USA
M. Brandt, RMIT University, Australia
B. Chichkov, Leibniz University Hannover, Germany
A. Clare, University of Nottingham, United Kingdom
R. Daub, Fraunhofer Institute for Casting, Composite and Processing Technology IGCV, Germany
G. Dearden, University of Liverpool, United Kingdom
I. Drstvenšek, University of Maribor, Slovenia
D. Drummer, Friedrich–Alexander Universität Erlangen–Nürnberg, Germany
J. Duflou, KU Leuven, Belgium
R. Fabbro, Arts et Métiers ParisTech, France
M. Farsari, Institute of Electronic Structure and Laser, Greece
E. Ferraris, KU Leuven, Belgium
A. Fougères, Institut National d'Optique, Canada
T. Frick, Technische Hochschule Nürnberg Georg Simon Ohm, Germany
A.G. Demir, Politecnico di Milano, Italy
E. Govekar, University of Ljubljana, Slovenia
C. Hagenlocher, University of Stuttgart, Germany
D.P. Hand, Heriot-Watt University, United Kingdom
G. Hennig, Daetwyler Graphics AG, Schweiz
S. Hertweck, TRUMPF Laser AG, Germany
P. Hoffmann, ERLAS GmbH, Deutschland
C. Holly, RWTH Aachen University, Germany
R. Holtz, University of Applied Sciences and Arts Northwestern, Switzerland
H. Huber, Munich University of Applied Sciences, Germany
Y. Ito, Nagaoka University of Technology, Japan
A. Jesacher, Medical University of Innsbruck, Austria
W. Jüptner, Universität Bremen, Germany
S. Kaierle, Laser Zentrum Hannover e.V., Germany
A. Kaplan, Luleå University of Technology, Sweden
J. Knorr, ASML Veldhoven, The Netherlands
M. Kogel-Hollacher, Precitec Optronik GmbH, Germany
D. Kracht, Laser Zentrum Hannover e.V., Germany
P. Krakhmalev, Karlstad University, Sweden
J.P. Kruth, KU Leuven, Belgium
V. Kujanpää, Lappeenranta University of Technology, Finland
J.K. Larsson, Autokropolis Engineering, Sweden
B. Lauwers, KU Leuven, Belgium
C. Leyens, Dresden University of Technology, Germany
L. Li, University of Manchester, United Kingdom
K. Löffler, Precitec GmbH & Co. KG, Germany
E. Lopez, Fraunhofer Institute for Material and Beam Technology IWS, Germany
M. Manyalibo, Lawrence Livermore National Laboratory, USA
J. Meijer, University of Twente, The Netherlands
C. Merklein, Schaeffler Technologies AG & Co. KG, Germany
M. Merklein, Friedrich–Alexander Universität Erlangen–Nürnberg, Germany
I. Miyamoto, Osaka University, Japan
C. Molpeceres, Technical University of Madrid, Spain
S.-J. Na, Xi'an Jiaotong University, People's Republic of China
B. Neuenschwander, University of Applied Sciences Bern, Switzerland
S. Nolte, Friedrich Schiller University Jena, Germany
L. Nyborg, Chalmers University of Technology, Sweden
F. Oefele, BMW AG, Germany
Y. Okamoto, Okayama University, Japan
S. Olschok, RWTH Aachen University, Germany
V. Onuseit, University of Stuttgart, Germany
A. Ostendorf, Ruhr-Universität Bochum, Germany
A. Otto, Vienna University of Technology, Austria
L. Overmeyer, Laser Zentrum Hannover e.V., Germany
G. Pallier, CAILABS, France
F. Palm, Airbus, France
M. Pereira, Federal University of Santa Catarina UFSC, Brazil
D. Petring, Fraunhofer Institute for Laser Technology ILT, Germany
F.E. Pfefferkorn, University of Wisconsin-Madison, USA
H. Piili, University of Turku, Finland
P. Plapper, Université du Luxembourg, Luxembourg
J. Pou, University of Vigo, Spain
B. Previtali, Politecnico Milano, Italy
R. Ramsayer, Robert Bosch GmbH, Germany
G. Requena, German Aerospace Center, Germany
M. Rethmeier, Bundesanstalt für Materialforschung und -prüfung (BAM), Germany
G.-W. Römer, University of Twente, The Netherlands
N. Sacks, Stellenbosch University, South Africa
A. Salminen, University of Turku, Finland
P. Salter, University of Oxford, United Kingdom
M. Schaper, Paderborn University, Germany
V. Schulze, Karlsruhe Institute of Technology KIT, Germany
J. Sehrt, Ruhr-Universität Bochum, Germany
B. Simonds, National Institute of Standards and Technology (NIST), USA
K. Sugioka, RIKEN Center for Advanced Photonics, Japan
S. Sun, Griffith University, Australia
H. K. Tönshoff, Leibniz Universität Hannover, Germany
E. Toyserkani, University of Waterloo, Canada
J. Tremel, Robert Bosch GmbH, Germany
G. Turichin, St. Petersburg State Marine Technical University, Russia
R. Vallée, Université Laval, Canada
B. Van Hooreweder, KU Leuven, Belgium
B. Vrancken, KU Leuven, Belgium
J. Weberpals, AUDI AG, Germany
K. Wegener, ETH Zürich, Switzerland
P. Weidinger, Brose Fahrzeugteile GmbH & Co. KG, Germany
V. Wippo, Laser Zentrum Hannover e.V., Germany
W.W. Wits, University of Twente, The Netherlands
P. Woizeschke, Technische Universität Dortmund, Germany
K. Wudy, Technical University of Munich, Germany
M. Zäh, Technical University of Munich, Germany
Z. Zalevsky, Bar-Ilan University, Israel
F. Zanger, Karlsruhe Institute of Technology KIT, Germany
A.R. Ziefuß, University of Duisburg-Essen, Germany