Internationally renowned experts

The International Committee consists of a number of independent experts. They are reviewing the contributions to the conference to assure the outstanding scientific quality of scientific papers and additionally the relevance for application of industrial papers.  

 

These are the members of our review committee:

International Review Committee of LANE 2020

C. B. Arnold, Princeton University, USA

P. Aubry, CEA/Paris-Saclay University, France

S. Barcikowski, University of Duisburg-Essen, Germany

P. Bartolo, The University of Manchester, United Kingdom

J. P. Bergmann, Technische Universität Ilmenau, Germany
D. Bourell, The University of Texas at Austin, USA

M. Brandt, RMIT University, Australia

B. Chichkov, Laser Zentrum Hannover e.V., Germany

A. Clare, The University of Nottingham, United Kingdom
G. Dearden, University of Liverpool, United Kingdom

P. Delaporte, Aix-Marseille Université, France

I. Drstvenšek, University of Maribor, Slovenia
D. Drummer, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany
J. Duflou, KU Leuven, Belgium

C. Emmelmann, Hamburg University of Technology, Germany
R. Fabbro, Arts et Métiers ParisTech, France

A. Fougères, Institut National d'Optique (INO), Canada

T. Frick, Technische Hochschule Nürnberg Georg Simon Ohm, Germany

P. Galarneau, Institut National d'Optique (INO), Canada

E. Govekar, University of Ljubljana, Slovenia

T. Graf, University of Stuttgart, Germany

C. Grigoropoulos, University of California at Berkeley, USA

D. P. Hand, Heriot-Watt University, United Kingdom

G. Hennig, Daetwyler Graphics AG, Switzerland

P. Hoffmann, ERLAS Erlanger Lasertechnik GmbH, Germany

R. Holtz, University of Applied Sciences and Arts Northwestern Switzerland

H. Huber, Munich University of Applied Sciences, Germany

Y. Ito, Nagaoka University of Technology, Japan

A. Jesacher, Medical University of Innsbruck, Austria

W. Jüptner, Universität Bremen, Germany

S. Kaierle, Laser Zentrum Hannover e.V., Germany
A. Kaplan, Luleå University of Technology, Sweden

S. Katayama, Osaka University, Japan

M. Kogel-Hollacher, Precitec GmbH & Co. KG, Germany

D. Kracht, Laser Zentrum Hannover e.V., Germany

P. Krakhmalev, Karlstad University, Sweden

J.-P. Kruth, KU Leuven, Belgium
V. Kujanpää, Lappeenranta University of Technology LUT, Finland

J. K. Larsson, Autokropolis Engineering, Sweden

B. Lauwers, KU Leuven, Belgium

L. Li, The University of Manchester, United Kingdom

K. Löffler, TRUMPF Laser- und Systemtechnik GmbH, Germany

J. Meijer, University of Twente, The Netherlands

C. Merklein, Schaeffler Technologies AG & Co. KG, Germany

M. Merklein, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany

I. Miyamoto, Osaka University, Japan

C. L. Molpeceres Alvarez, Technical University of Madrid, Spain

S.-J. Na, Xi‘an Jiaotong University, China

B. Neuenschwander, Bern University of Applied Sciences, Switzerland

F. Oefele, BMW AG, Germany

S. Olschok, RWTH Aachen University, Germany

A. Ostendorf, Ruhr-Universität Bochum, Germany
A. Otto, Vienna University of Technology, Austria
L. Overmeyer, Laser Zentrum Hannover e.V., Germany

F. Palm, Airbus Defence and Space GmbH, Germany

M. Pereira, Universidade Federal de Santa Catarina, Brazil

D. Petring, Fraunhofer Institute for Laser Technology ILT, Germany

F. E. Pfefferkorn, University of Wisconsin-Madison, USA

P. Plapper, University of Luxembourg, Luxembourg
J. M. Pou, University of Vigo, Spain

R. Ramsayer, Robert Bosch GmbH, Germany

U. Reisgen, RWTH Aachen University, Germany

M. Rethmeier, Bundesanstalt für Materialforschung und -prüfung, Germany
G.-W. Römer, University of Twente, The Netherlands
A. Salminen, Lappeenranta University of Technology LUT, Finland

P. Salter, University of Oxford, United Kingdom

D. Schmid, AUDI AG, Germany

M. Schmidt, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany

R. Schmitt, Fraunhofer Institute for Production Technology IPT, Germany

I. Smurov, École Nationale d'Ingénieurs de Saint-Etienne, France

K. Sugioka, RIKEN Center for Advanced Photonics, Japan

H.-K. Tönshoff, Leibniz Universität Hannover, Germany

E. Toyserkani, University of Waterloo, Canada

J. Tremel, Robert Bosch GmbH, Germany

G. Turichin, Peter the Great St.Petersburg Polytechnic University, Russia

F. Vollertsen, BIAS GmbH, Germany

K. Wegener, ETH Zurich, Switzerland
P. Weidinger, Brose Fahrzeugteile GmbH & Co. KG, Germany

M. F. Zäh, Technische Universität München, Germany
Z. Zalevsky, Bar-IIan University, Israel
M. Zhong, Tsinghua University, China

D. Zibar, Technical University of Denmark, Denmark