Conference Organisation
Bayerisches Laserzentrum GmbH (blz)
in cooperation with the
Chair of Photonic Technologies (LPT),
University of Erlangen-Nürnberg
Prof. Michael Schmidt
Prof. Manfred Geiger
Dr. Hans-Joachim Krauß
Bayerisches Laserzentrum GmbH (blz)
in cooperation with the
Chair of Photonic Technologies (LPT),
University of Erlangen-Nürnberg
Prof. Michael Schmidt
Prof. Manfred Geiger
Dr. Hans-Joachim Krauß
Conference Office
Bayerisches Laserzentrum GmbH (blz)
Konrad-Zuse-Straße 2-6
91052 Erlangen
Germany
Fax number for sending of Registration Form, Order Form and other correspondence: +49-(0)9131-9779011
Bayerisches Laserzentrum GmbH (blz)
Konrad-Zuse-Straße 2-6
91052 Erlangen
Germany
Fax number for sending of Registration Form, Order Form and other correspondence: +49-(0)9131-9779011
For any questions concerning the LANE please contact:
Christian Brock, Phone: +49-(0)9131-8523239
Stephanie Eckert, Phone: +49-(0)9131-9779038
E-Mail: info@lane-conference.org
Christian Brock, Phone: +49-(0)9131-8523239
Stephanie Eckert, Phone: +49-(0)9131-9779038
E-Mail: info@lane-conference.org
Scientific Committee
Bach, F.-W.; University of Hannover, Germany
Beyer, E.; Fraunhofer IWS, Dresden, Germany
Cho, H.; KAIST, Daejeon, Republic of Korea
Dearden, G.; University of Liverpool, UK
Galarneau, P.; Institut National d'Optique, Quebec City, Canada
Geiger, M.; Bayerisches Laserzentrum, Erlangen, Germany
Graf, T.; University of Stuttgart, Germany
Jüptner, W.; University of Aberdeen, UK
Kruth, J.-P.; University of Leuven, Belgium
Meijer, J.; University of Twente, The Netherlands
Miyamoto, I.; Osaka University, Japan
Ostendorf, A.; University of Bochum, Germany
Otto, A.; University of Erlangen-Nürnberg, Germany
Poprawe, R.; Fraunhofer ILT, Aachen, Germany
Pou, J. M.; University of Vigo, Spain
Schmidt, M.; University of Erlangen-Nürnberg, Germany
Schuöcker, D.; Technical University of Vienna, Austria
Sepold, G.; BIAS, Bremen, Germany
Tönshoff, H. K.; Laser Zentrum Hannover, Germany
Turichin, G.; University of St. Petersburg, Russia
Vollertsen, F.; BIAS, Bremen, Germany (Chairman)
Watkins, K.; University of Liverpool, UK
Wu, Y.; Shanghai Jiao Tong University, P.R. China
Zäh, M.; Technical University of Munich, Germany
Zeilhofer, H.-F.; University Hospital Basel, Switzerland
Bach, F.-W.; University of Hannover, Germany
Beyer, E.; Fraunhofer IWS, Dresden, Germany
Cho, H.; KAIST, Daejeon, Republic of Korea
Dearden, G.; University of Liverpool, UK
Galarneau, P.; Institut National d'Optique, Quebec City, Canada
Geiger, M.; Bayerisches Laserzentrum, Erlangen, Germany
Graf, T.; University of Stuttgart, Germany
Jüptner, W.; University of Aberdeen, UK
Kruth, J.-P.; University of Leuven, Belgium
Meijer, J.; University of Twente, The Netherlands
Miyamoto, I.; Osaka University, Japan
Ostendorf, A.; University of Bochum, Germany
Otto, A.; University of Erlangen-Nürnberg, Germany
Poprawe, R.; Fraunhofer ILT, Aachen, Germany
Pou, J. M.; University of Vigo, Spain
Schmidt, M.; University of Erlangen-Nürnberg, Germany
Schuöcker, D.; Technical University of Vienna, Austria
Sepold, G.; BIAS, Bremen, Germany
Tönshoff, H. K.; Laser Zentrum Hannover, Germany
Turichin, G.; University of St. Petersburg, Russia
Vollertsen, F.; BIAS, Bremen, Germany (Chairman)
Watkins, K.; University of Liverpool, UK
Wu, Y.; Shanghai Jiao Tong University, P.R. China
Zäh, M.; Technical University of Munich, Germany
Zeilhofer, H.-F.; University Hospital Basel, Switzerland